Information for "Automatic Testing of Systems on Chip"
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Basic information
| Display title | Automatic Testing of Systems on Chip |
| Default sort key | Automatic Testing of Systems on Chip |
| Page length (in bytes) | 2,371 |
| Page ID | 4092 |
| Page content language | English (en) |
| Indexing by robots | Allowed |
| Number of views | 3,321 |
| Number of redirects to this page | 0 |
| Counted as a content page | Yes |
Page protection
| Edit | Allow all users |
| Move | Allow all users |
Edit history
| Page creator | Ceres (Talk | contribs) |
| Date of page creation | 14:38, 21 October 2014 |
| Latest editor | Ceres (Talk | contribs) |
| Date of latest edit | 09:00, 11 October 2016 |
| Total number of edits | 2 |
| Total number of distinct authors | 1 |
| Recent number of edits (within past 91 days) | 0 |
| Recent number of distinct authors | 0 |
Page properties
| Transcluded template (1) | Template used on this page: |
