Difference between revisions of "MBT Reading Group"
From CERES
Line 1: | Line 1: | ||
== Current Papers == | == Current Papers == | ||
− | *''' | + | *'''May 19, 2016:''' [http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=4339252 Feature Diagrams and Logics: There and Back Again] |
** Moderator: Vanderson | ** Moderator: Vanderson | ||
Revision as of 08:19, 9 May 2016
Current Papers
- May 19, 2016: Feature Diagrams and Logics: There and Back Again
- Moderator: Vanderson
Upcoming Papers
- Feature Diagrams: A Survey and a Formal Semantics
- Feature Models, Grammars, and Propositional Formulas
- Does this fault lead to failure? Combining refinement and input–output conformance checking in fault-oriented test-case generation
- Perspectives on White-Box Testing: Coverage, Concurrency, and Concolic Execution
- Abstraction-driven Concolic Testing
- Applying Incremental Model Slicing to Product-Line Regression Testing
- Hybrid Learning: Interface Generation through Static, Dynamic, and Symbolic Analysis
Previous Papers
- March 2, 2016: A Theory of Predicate-Complete Test Coverage and Generation
- Moderator: Masoumeh
- February 10, 2016: Towards Composition of Conformant Systems
- Attendees: Mahsa, Masoumeh, Mohammad, Sebastian, Vanderson
- Moderator: Mohammad
- January 28, 2016: Model Checking Lots of Systems: Efficient Verification of Temporal Properties in Software Product Lines
- Attendees: Mahsa, Masoumeh, Mohammad, Sebastian, Vanderson
- Moderator: Mahsa
- January 14, 2016: Model Checking Lots of Systems: Efficient Verification of Temporal Properties in Software Product Lines
- Attendees: Mahsa, Masoumeh, Mohammad, Sebastian, Vanderson
- Moderator: Mahsa
- December 8, 2015: Automated Test Design for Boundaries of Product Line Variants
- Attendees: Mahsa, Masoumeh, Mohammad, Sebastian, Vanderson
- Moderator: Vanderson
- November 28, 2015: A Classification and Survey of Analysis Strategies for Software Product Lines
- Attendees: Mahsa, Masoumeh, Mohammad, Sebastian, Vanderson, Wojciech
- Moderator: Sebastian